Design for Reliability, Edited by Dana Crowe, & Alec Feinberg.

DESIGN FOR RELIABILITY
by Dana Crow (Editor), Alec Feinberg (Editor)

"This book is definitely a strong addition to the body of knowledge for Reliability professionals
and for any company that wants to improve the business competitiveness by improving
product reliability…I have been fortunate to know [the DfR activity at M/A-COM/Tyco] and I
also know how impressed other organizations are when they get to see it. This is an
outstanding industry leader that has documented the implemented practice in this book."
- James E. "Gene" Bridgers, RESULTS MA

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"…is a practical and useful book …description of the "stage gate approach"…emphasis on
accelerated test methods…description of physics of failure and failure investigation
techniques…"
- Patrick O'Connor, author of Practical Reliability Engineering

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“Engineers at the M/A-COM Tyco Electronics revise the company's manual of the same title,
which explains to engineers and managers how the design for reliability approach can
enhance the concurrent design cycles. They argue that the stage gate process provides the
maximum level of benefit to the design while minimizing the cycle time impact to that
process, producing the highest levels of product reliability possible. The topics include
understanding customer requirement, screening and monitoring, semiconductor process
reliability, analytical physics, concepts in accelerated testing, and evaluating product risk.”
Book News, Inc., Portland, OR (booknews.com)

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“Today's marketplace demands product reliability. At the same time, it places ever-increasing
demands on products that push the limits of their performance and their functional life, and it
does so with the expectation of lower per-unit product costs. To meet these demands,
product design now requires a focused, streamlined, concurrent engineering process that will
produce a product at the lowest possible cost in the least amount of time.

“Design for Reliability provides a systematic approach to the design process that is sharply
focused on reliability and firmly based on the physics of failure. It imparts an understanding of
how, why, and when to use the wide variety of reliability engineering tools available and offers
fundamental insight into the total design cycle. Applicable from the idea phase of the product
development cycle through product obsolescence, Design for Reliability (DfR) concepts
integrated with reliability verification and analytical physics form a coherent stage gate/phase
design process that helps ensure that a product will meet customers' reliability objectives.

“Whether you are a high-volume manufacturer of consumer items or a low volume producer of
military commodities, your goal is the same: to bring a product to market using a process
focused on designing out or mitigating potential failure modes prior to production release.
Readers of Design for Reliability will learn to meet that goal and move beyond solidifying a
basic offering to the marketplace to creating a true competitive advantage.”

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FROM THE AUTHOR

“As one of the authors/editors of this book, let me describe the valuable technical content.
First, let me impress upon you that this is a rare practical work in reliability written by
members of a highly technical company that apply reliability science every day to products.
Thus, academics are stressed only as a tool. Therefore, this book has something for
everyone. It starts off with a management perspective on how to organize a reliability
program. Chapter 1 - 5 overview a unique stage-gate approach to growing reliability. What
tools and building blocks are needed from a management perspective to be world-class.
What tests to perform when is also key. This approach assures optimum reliability grow in a
commercial atmosphere of on-time reliable product deliveries. The book then evolves
technically providing essential engineering topics. Chapter 6 describes key information for
performing process reliability studies. Chapter 7, is without question a compact chapter on
failure analysis that describes each analysis tool including SEM, SAM, EDS, FTIR, FIB,
SIMS, etc. The numerous physics of failure analysis examples in diffusion, corrosion,
intermetallics, ESD etc are illustrated with detailed FA images. Then Chapter 8 provides what
you need to know for reliability statistics. It covers basic definitions for failure rate, CDF, PDF,
the main distributions used (Weibull, lognormal, Exponential, Normal). A well-organized
chapter presenting key essential reliability statistics needed in industry. Chapter 9 details
accelerated testing, the primary historical equations governing temperature,
temperature-humidity, vibration and temperature cycle/shock, and electromigration. It
provides common sense guidelines for assessing overstressing. How to use these equations
for test planning. Advance topics including Step-stress and how to describe life distributions
as a function of stress. Chapter 10 on Accelerated Reliability Growth is fairly unique. What
tests do you perform and when, using stage-gate and recent accelerated reliability growth
mathematics for planning. Growth can be obtained and assessed in a timely manner. Chapter
11 provides the essential for system reliability. Series, parallel, and n of k subsystems as
well as predicting reliability using both Bellcore, and 217 methods are addressed. Chapter 12
is an excellent overview of FMEA. Chapter 13 teaches methods for evaluating product risk
and conducting risk program management. Lastly, Chapter 14 is an advanced topic,
thermodynamic reliability engineering. No other book teaches thermodynamics and how the
1st and 2nd laws are fundamental to the science for Physics-of-Failure. In no other book can
a reader find derivations for accelerated testing time compression expressions in fatigue,
temperature-humidity, Miner?s rule, and diffusion. Additionally, an advanced Arrhenius kinetic
topics on logarithmic-in-time aging are provided. This topic as a seminar received the highest
ratings at the 2001 RAMS conference. Thank You” - Alec Feinberg.

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TABLE OF CONTENTS

The Stage Gate Process
Reliability Science
Understanding Customer Requirements
Design Assessment Reliability Testing
Design Maturity Testing (DMT)
Screening and Monitoring
Supporting Stage Gate
Semiconductor Process Reliability
Analytical Physics
Topics in Reliability
Reliability Statistics Simplified
Concepts in Accelerated Testing
Accelerated Reliability Growth
Reliability Predictive Modeling
Failure Modes and Effects Analysis
Evaluating Product Risk
Thermodynamic Reliability Engineering

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2001, 256 pages.
Order #DR591.
Special Order.
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